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Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupatio
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Shipping options
Offer policy
OBO - Seller accepts offers on this item.
Details
Return policy
Purchase protection
Payment options
PayPal accepted
PayPal Credit accepted
Venmo accepted
PayPal, MasterCard, Visa, Discover, and American Express accepted
Maestro accepted
Amazon Pay accepted
Item traits
Category: | |
---|---|
Quantity Available: |
Only one in stock, order soon |
Condition: |
Like New |
ISBN: |
1107124360 |
Format: |
Hardcover |
Type: |
Textbook |
Language: |
English |
Publication Year: |
2017 |
Book Title: |
Next Generation Technology-Enhanced Assessment: Global Perspectiv |
Number of Pages: |
440 Pages |
Publication Name: | |
Publisher: |
Cambridge University Press |
Subject: |
Training/Applied Psychology |
Item Height: |
1 in |
Item Weight: |
25.5 Oz |
Author: |
Dave Bartram |
Item Length: |
9.3 in |
Subject Area: |
Psychology/Business & Economics |
Item Width: |
6.2 in |
Series: |
Educational and Psychological Testing in a Global Context Ser. |
Listing details
Shipping discount: |
Shipping weights of all items added together for savings. |
---|---|
Posted for sale: |
February 7 |
Item number: |
1718984612 |
Item description
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- Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupatio
- 1 in stock
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