Rendered at 13:32:17 11/24/24
Jeol-Technics PH01177-3 Pull From Scanning Electron Microscope PP01177-3
Shipping options
Estimated to arrive by Tue, Dec 17th.
Details
$130.00 via International Shipping (2 to 3 weeks) to United States
Offer policy
OBO - Seller accepts offers on this item.
Details
Return policy
Full refund available within 30 days
Purchase protection
Payment options
PayPal accepted
PayPal Credit accepted
Venmo accepted
PayPal, MasterCard, Visa, Discover, and American Express accepted
Maestro accepted
Amazon Pay accepted
Shipping options
Estimated to arrive by Tue, Dec 17th.
Details
$130.00 via International Shipping (2 to 3 weeks) to United States
Offer policy
OBO - Seller accepts offers on this item.
Details
Return policy
Full refund available within 30 days
Purchase protection
Payment options
PayPal accepted
PayPal Credit accepted
Venmo accepted
PayPal, MasterCard, Visa, Discover, and American Express accepted
Maestro accepted
Amazon Pay accepted
Item traits
| Category: | |
|---|---|
| Quantity Available: |
Only one in stock, order soon |
| Condition: |
Used |
| Model: |
Jeol-Technics PH01177-3 |
| MPN: |
PH01177-3 |
| Country/Region of Manufacture: |
Japan |
| Seller Notes: |
“This is used item in good condition” |
| Brand: |
Jeol-Technics |
| Jeol-Technics: |
Jeol-Technics PH01177-3 Pull From Scanning Electron Microscope PP |
| UPC: |
does not apply |
Listing details
| Seller policies: | |
|---|---|
| Shipping discount: |
No combined shipping offered |
| Posted for sale: |
More than a week ago |
| Item number: |
1552602418 |
Item description
More in store
Added to your wish list!
- Jeol-Technics PH01177-3 Pull From Scanning Electron Microscope PP01177-3
- 1 in stock
- Price negotiable
- Handling time 3 days. Estimated delivery: Tue, Dec 17th
- Returns/refunds accepted
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